Electric field penetration effects in time-of-flight measurements

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dc.contributor.authorAbeywarna, U.K.en_US
dc.contributor.authorAriyaratne, T.R.en_US
dc.date.accessioned2012-05-02T05:50:17Z
dc.date.available2012-05-02T05:50:17Z
dc.date.issued2003en_US
dc.identifier.citationSri Lankan Journal of Physics4pp.35-45en_US
dc.identifier.urihttps://dl.nsf.gov.lk/handle/1/8227
dc.publisherInstitute of Physics. Colomboen_US
dc.subjectPhysicsen_US
dc.subjectMass spectrometryen_US
dc.subjectField penetrationen_US
dc.subjectTime-of-flight methoden_US
dc.subjectIon optical propertiesen_US
dc.subjectAxial energyen_US
dc.subjectPlasma desorptionen_US
dc.subjectMass analysisen_US
dc.titleElectric field penetration effects in time-of-flight measurementsen_US
dc.typeArticleen_US

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