Effecst of residual gas pressure on the mass resolution and the molecular ion yield of a time-of-light mass spectrometer

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dc.contributor.authorPiyadasa, C.K.G.
dc.contributor.authorAriyaratne, T.R.
dc.contributor.authorWijayaratna, W.M.K.P.
dc.date.accessioned2016-10-20T09:19:21Z
dc.date.available2016-10-20T09:19:21Z
dc.date.issued1996
dc.identifier.citationProceedings of the 52nd Annual Sessions of the Sri Lanka Association for the Advancement of Science:p.171
dc.identifier.reportnumberFR 0671
dc.identifier.researchgrantnumberRG/92/P/002
dc.identifier.urihttps://dl.nsf.gov.lk/handle/1/23426
dc.subjectPhysics
dc.subjectMass spectrometers
dc.subjectResidual gases
dc.subjectMass resolution
dc.subjectMolecular ion yield
dc.titleEffecst of residual gas pressure on the mass resolution and the molecular ion yield of a time-of-light mass spectrometer
dc.typeArticle

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