Abeywarna, U.K.Ariyaratne, T.R.2012-05-022012-05-022003Sri Lankan Journal of Physics4pp.35-45https://dl.nsf.gov.lk/handle/1/8227PhysicsMass spectrometryField penetrationTime-of-flight methodIon optical propertiesAxial energyPlasma desorptionMass analysisElectric field penetration effects in time-of-flight measurementsArticle