Effecst of residual gas pressure on the mass resolution and the molecular ion yield of a time-of-light mass spectrometer

Piyadasa, C.K.G.Ariyaratne, T.R.Wijayaratna, W.M.K.P.2016-10-202016-10-201996Proceedings of the 52nd Annual Sessions of the Sri Lanka Association for the Advancement of Science:p.171https://dl.nsf.gov.lk/handle/1/23426PhysicsMass spectrometersResidual gasesMass resolutionMolecular ion yieldEffecst of residual gas pressure on the mass resolution and the molecular ion yield of a time-of-light mass spectrometerArticleRG/92/P/002FR 0671