An efficient algorithm to calculate relative permittivity from multi-layered layered stripline based measurements at microwave frequencies

Gunawardena, A.U.A.W.2018-06-132018-06-132018-03Journal of the National Science Foundation of Sri Lanka, 46(1):p.103-108https://dl.nsf.gov.lk/handle/1/23642Dielectric measurementMulti-layerNewton RaphsonPermittivityAn efficient algorithm to calculate relative permittivity from multi-layered layered stripline based measurements at microwave frequenciesArticle