Yoosoofmiya, R.M.Gamlath, K.A.L.L.W.2012-05-022012-05-022003Sri Lankan Journal of Physics4pp.21-33https://dl.nsf.gov.lk/handle/1/8226PhysicsPlasma desorption mass spectrometrySecondary ionsClassical equationRelativistic equationTime of flight methodElectronic sputteringMass analysisRelativistic calculations of secondary ions produced in plasma desorption mass spectrometryArticle