The modified control charts for monitoring the error detection of process control under different estimators

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JNSF_52_1_17.pdf (6.78 MB)

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2024-03

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NSF:Colombo

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Control charts, Machine errors, Manufacturing process, Modified maximum likelihood estimator, Manufacturing process, Modified maximum likelihood estimator, Percentile estimator, Reflected power function distribution

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Journal of the National Science Foundation of Sri Lanka,52(1):p.17-34

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https://dl.nsf.gov.lk/handle/1/25818

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Journal of the National Science Foundation of Sri Lanka

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