An efficient algorithm to calculate relative permittivity from multi-layered layered stripline based measurements at microwave frequencies

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dc.contributor.authorGunawardena, A.U.A.W.
dc.date.accessioned2018-06-13T05:41:47Z
dc.date.available2018-06-13T05:41:47Z
dc.date.issued2018-03
dc.identifier.citationJournal of the National Science Foundation of Sri Lanka, 46(1):p.103-108
dc.identifier.urihttps://dl.nsf.gov.lk/handle/1/23642
dc.publisherNSF:Colombo
dc.subjectDielectric measurement
dc.subjectMulti-layer
dc.subjectNewton Raphson
dc.subjectPermittivity
dc.titleAn efficient algorithm to calculate relative permittivity from multi-layered layered stripline based measurements at microwave frequencies
dc.typeArticle

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