Electric field penetration effects in time-of-flight measurements

Files

SLJP-4-35.pdf (622.91 KB)

Date

Authors

Abeywarna, U.K.

Ariyaratne, T.R.

Publisher

Institute of Physics. Colombo

Keywords

Physics, Mass spectrometry, Field penetration, Time-of-flight method, Ion optical properties, Axial energy, Plasma desorption, Mass analysis

Citation

Sri Lankan Journal of Physics4pp.35-45

URI

https://dl.nsf.gov.lk/handle/1/8227

Collections

Sri Lankan Journal of Physics